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Papers by Author: J.H. Won

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Atomic-Scale Engineering of the SiC-SiO₂ Interface

Authors: Sokrates T. Pantelides, G. Duscher, M. Di Ventra, Ryszard Buczko, K. McDonald, M.B. Huang, Robert A. Weller, Israel J.R. Baumvol, Fernanda Chiarello Stedile, C. Radtke, S.J. Pennycook, G.Y. Chung, Chin Che Tin, John R. Williams, J.H. Won, Leonard C. Feldman

1133

The Effect of Si:C Source Ratio on SiO₂/SiC Interface State Density for Nitrogen Doped 4H and 6H-SiC

Authors: G.Y. Chung, Chin Che Tin, J.H. Won, John R. Williams

1097