HomeJ.M.M. de Nijs

Papers by Author: J.M.M. de Nijs

Paper TitlePage

Native and Irradiation-Induced Defects in SiO₂ Structures Studied by Positron Annihilation Techniques

Authors: A. Rivera, I. Montilla, A. Alba García, R. Escobar Galindo, C.V. Falub, A. van Veen, H. Schut, J.M.M. de Nijs, P. Balk

64

Characterization of Defects at the Si/SiO₂ Interface of a Polysilicon Gated MOS System by Monoenergetic Positrons

Authors: M. Clement, J.M.M. de Nijs, H. Schut, A. van Veen, P. Balk

718