HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
12/9/2012 - 12/12/2012
ACAM7: The 7th Australasian Congress on Applied Mechanics
11/16/2012 - 11/18/2012
2nd International Conference on Manufacturing Engineering and Automation (ICMEA2012)
11/16/2012 - 11/18/2012
more...
Articles by author: J. Wagner
9 papers on 1 page:
1
Hall Effects, DLTS and Optical Investigations on the Intrinsic 78/203 meV Acceptor in GaAs
Published in:
Defects in Semiconductors 15
(p951)
Incorporation of Be Into In
x
Ga
1-x
As (0.004≤x≤0.17) Studied by Photoluminescence and Resonant Raman Spectroscopy of Local Vibrational Modes
Published in:
Defects in Semiconductors 17
(p241)
Incorporation of Silicon in (311)A and (111)A GaAs Grown by Molecular Beam Epitaxy
Published in:
Defects in Semiconductors 17
(p259)
Infrared and Raman Studies of Carbon Impurities in Highly Doped MBE AlAs:C
Published in:
Defects in Semiconductors 17
(p247)
Infrared and Raman Studies of Si Delta-Doped (100) GaAs Grown by MBE at 400°C on c(4x4) Surfaces
Published in:
Defects in Semiconductors 18
(p425)
Plasma Deposition, Properties and Structure of Amorphous Hydrogenated Carbon Films
Published in:
Properties and Characterization of Amorphous Carbon Films
(p41)
Raman Spectroscopic Study of Si Local Vibrational Modes in GaAs
Published in:
Defects in Semiconductors 15
(p815)
Raman Spectroscopy of Dopant Impurities in Homogeneously and Planar (δ) Doped III-V Semiconductors
Published in:
Shallow Impurities in Semiconductors IV
(p1)
The Assignment of the 78/203meV Double Acceptor in GaAs to B
As
Impurity Antisite Centers
Published in:
Defects in Semiconductors 17
(p229)
Username:
Password: