Raman Spectroscopy of Dopant Impurities in Homogeneously and Planar (δ) Doped III-V Semiconductors |
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| Journal | Materials Science Forum (Volumes 65 - 66) |
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| Volume | Shallow Impurities in Semiconductors IV |
| Edited by | Gordon Davies |
| Pages | 1-10 |
| DOI | 10.4028/www.scientific.net/MSF.65-66.1 |
| Authors | J. Wagner |
| Full Paper | 
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