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Articles by author: Jan Linnros

• Characterization of 4H-SiC Band-Edge Absorption Properties by Free-Carrier Absorption Technique with a Variable Excitation Spectrum
  Published in: Silicon Carbide and Related Materials 2001 (p617)
• Depth- and Time-Resolved Free Carrier Absorption in 4H SiC Epilayers: A Study of Carrier Recombination and Transport Parameters
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p529)
• Determination of the Polarization Dependence of the Free-Carrier-Absorption in 4H-SiC at High-Level Photoinjection
  Published in: Silicon Carbide and Related Materials - 1999 (p555)
• Evaluation of Auger Recombination Rate in 4H-SiC
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p533)
• Free Carrier Diffusion in 4H-SiC
  Published in: Silicon Carbide and Related Materials 2000 (p353)
• Free Carrier Diffusion Measurements in Epitaxial 4H-SiC with a Fourier Transient Grating Technique: Injection Dependence
  Published in: Silicon Carbide and Related Materials - 1999 (p671)
• Fundamental Band Edge Absorption in 3C-SiC: Phonon Absorption Assisted Transitions
  Published in: Silicon Carbide and Related Materials 2009 (p231)
• In Situ Studies of Structural Instability in Operating 4H-SiC PiN Diodes
  Published in: Silicon Carbide and Related Materials - 2002 (p933)
• Investigation of Electroluminescence across 4H-SiC p⁺/n^-/n⁺ Structures Using Optical Emission Microscopy
  Published in: Silicon Carbide and Related Materials 2000 (p389)
• Investigation of Excess Carrier Distributions in 4H-SiC Power Diodes under Static Conditions and Turn-On
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p1053)
• Investigation of Stacking Fault Formation in Hydrogen Bombarded 4H-SiC
  Published in: Silicon Carbide and Related Materials 2004 (p327)
• Investigation of Structural Stability in 4H-SiC Structures with Heavy Ion Implanted Interface
  Published in: Silicon Carbide and Related Materials 2005 (p395)
• LBIC Control Mapping of Textured Silicon Thin Film Obtained by Liquid Phase Epitaxy on Transferable Silicon Grid
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p49)
• Optical Characterization of 4H-SiC p⁺n^-n⁺ Structures Applying Time- and Spectrally Resolved Emission Microscopy
  Published in: Silicon Carbide and Related Materials - 1999 (p683)
• Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes
  Published in: Silicon Carbide and Related Materials 2001 (p431)