Papers by Author: Ju Hyun Myung

Abstract: Indium oxide (In2O3) films was deposited on TiN substrates by the metal organic chemical vapor deposition technique using a triethylindium and oxygen mixture. The films deposited at 250-350°C were polycrystalline, while that deposited at 200°C was close to amorphous. XRD and SEM analyses indicated that the films grown at 350°C had grained structures with the (222) preferred orientation.

Abstract: We have prepared the gallium oxide (Ga2O3) films on sapphire substrates by a thermal evaporation of GaN powders. We have characterized the films by using the x-ray diffraction (XRD), scanning electron microscopy (SEM), and the photoluminescence (PL). SEM and XRD revealed that the deposits were Ga2O3 thin films with monoclinic structure. PL spectrum of Ga2O3 films under excitation at 325 nm showed a blue emission.

Abstract: In2O3 materials consisting of dense arrays of vertically aligned rod-like structures were deposited on sapphire substrates by thermal chemical vapor deposition (CVD) using triethylindium (TEI) and oxygen as precursors at a substrate temperature of 350 oC. The rod-like structure with a triangular cross section had a cubic structure, exhibiting preferred crystallographic orientation in the [111] direction. The photoluminescence spectra of In2O3 structures under excitation at 325 nm revealed a visible emission.

Abstract: We have synthesized the film-like and rod-like structures of indium oxide (In2O3) by metalorganic chemical vapor deposition (MOCVD) method. The structural morphology of the deposits changed from the film to the arrays of 1-dimensional (1-D) materials with increasing the deposition temperature. The 1-D materials with the serrated surfaces prepared at 350°C possessed a crystalline cubic structure and had preferentially grown along the [111] direction.

Abstract: One-dimensional structures of tin oxide (SnO2) on TiN-coated substrates were obtained by simple heating of Sn powders. X-ray diffraction, high-resolution transmission electron microscopy, and the selected area electron diffraction showed that 1D structures are composed of SnO2 with rutile structure. The photoluminescence of the structures in the visible region suggests possible applications in nanoscaled optoelectronic devices.

Abstract: We have synthesized gallium oxide (Ga2O3) nanomaterials at two different growth temperatures on iridium (Ir)-coated substrates by thermal evaporation of GaN powders. The products consist mainly of nanobelts, with some additional nanosheets. The nanobelts were of a single-crystalline monoclinic Ga2O3 structure. The broad emission photoluminescence band of 900°C-products had a different peak position from that of the 970°C-products.

Abstract: We report on the first synthesis of nanosized In2O3 rods using the TEI as a precursor in the presence of oxygen. The samples were characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy. XRD analysis revealed that the products are In2O3 phase with a tetragonal cubic structure. SEM analysis indicated that the obtained nanorods have a circular cross section and a diameter in the range of 50-150 nm.

Abstract: We have demonstrated the growth of ZnO thin films with c-axis orientation at room temperature on various substrates such as Si(100), SiO2, and sapphire by the r.f. magnetron sputtering method. X-ray diffraction (XRD) and scanning electron microscopy altogether indicated that the larger grain size and the higher crystallinity were attained when the ZnO films were deposited on sapphire substrates, compared to the films on Si or SiO2 substrates. The c-axis lattice constant decreased by thermal annealing for the ZnO films deposited on Si or SiO2 substrates, while increased by the thermal annealing for the ZnO films grown on sapphire substrates.