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Articles by author: K.P. Rodbell

• Current and Potential Uses of Positron Beams to Study Porosity in Low-k Dielectric Thin Films
  Published in: Positron Annihilation - ICPA-12 (p15)
• Effects of Dielectric Roughness on Texture of Both PVD Seed Layers and EP Copper
  Published in: Texture and Anisotropy of Polycrystals II (p391)
• Study of Positronium in Low-k Dielectric Films by Means of 2D-Angular Correlation Experiments at a High-Intensity Slow-Positron Beam
  Published in: Positron Annihilation - ICPA-12 (p585)
• Texture and Grain Structure Effects on the Reliability of Microelectronic Interconnects
  Published in: Textures of Materials - ICOTOM 10 (p1435)