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Papers by Author: M. Midorikawa

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Characterization of the Interfaces between SiC and Oxide Films by Spectroscopic Ellipsometry

Authors: Yuichi Tomioka, T. Iida, M. Midorikawa, H. Tukada, K. Yoshimoto, Yasuto Hijikata, Hiroyuki Yaguchi, Masahito Yoshikawa, Yuuki Ishida, Ryouji Kosugi, Sadafumi Yoshida

1029

The Investigation of 4H-SiC/SiO₂ Interfaces by Optical and Electrical Measurements

Authors: Yuuki Ishida, Tetsuo Takahashi, Hajime Okumura, Tamotsu Jikimoto, Hidekazu Tsuchida, Masahito Yoshikawa, Yuichi Tomioka, M. Midorikawa, Yasuto Hijikata, Sadafumi Yoshida

1013