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Articles by author: Matej Jergel

• Application of the Distorted-Wave Born Approximation to Interface Characterization in W/Si Multilayer Thin Films
  Published in: European Powder Diffraction 5 (p454)
• Co/Si/W/Si Multilayers with Enhanced Thermal Stability for Soft X-Ray and UV Optics
  Published in: European Powder Diffraction EPDIC 7 (p364)
• Effect of Ion-Beam Polishing on the Interface Quality in a Ti/C Multilayer Mirror for 'Water Window'
  Published in: European Powder Diffraction 6 (p184)
• On Similar Electrical, Optical and Structural Properties of MOS Structures Prepared on a-Si:H/c-Si, Porous Silicon/c-Si, and c-Si
  Published in: Thin Films and Porous Materials (p11)
• Relaxation Changes in the Structure of the Cu_53.5Zr_44.3Nb_2.2 Amorphous Alloy
  Published in: Amorphous Metallic Materials II (p221)
• Relaxation of the Cu₅₄Zr₄₄Nb₂ Amorphous Alloy
  Published in: Amorphous Metallic Materials II (p229)
• Structural Relaxation of Zr₅₅Ni₂₅Al₂₀ Ball-Milled Amorphised Powder
  Published in: Mechanically Alloyed, Metastable and Nanocrystalline Materials (p583)
• Structural Study of Amorphous W/Si Multilayers
  Published in: Amorphous Metallic Materials III (p285)
• The Effect of (Ba/Sr) Substitution on Tl-Based Superconducting Thin Films Prepared from Fluoride Precursors
  Published in: Solid State Chemistry V (p571)
• The Study of Crystallization Kinetics of Fe_85-XCo_XB₁₅ Metallic Glasses with Nonisothermal Dilatometry
  Published in: Amorphous Metallic Materials II (p143)
• X-Ray Reflectivity and Diffuse Scattering Study of Thermally Treated W_1-xSi_x/Si Multilayers
  Published in: European Powder Diffraction 4 (p505)