Papers by Author: Mirco D'Incau

Abstract: The recent evolution of powder diffraction line profile analysis toward full pattern methods is discussed. Specific reference is made to the Whole Powder Pattern Modelling (WPPM), as applied to metals and ceramics subjected to strong plastic deformation. Examples concerning three different materials science studies are shown to illustrate features and potentialities of the WPPM approach.

Abstract: A new algorithm is proposed to determine the through-thickness residual stress gradient by X-ray Diffraction measurements on progressively thinned components. The procedure is based on a chemical or electrochemical attack of the component surface, which is then measured at each thinning stage. The simple algorithm provided for by a specific norm has been revised to take into account the X-ray absorption effects and the conditions of mechanical equilibrium of the component. The new procedure is illustrated for a typical case of study concerning a shot-peened metal component.