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Articles by author: Morten Kildemo

• Anisotropic Dielectric Function Properties of Semi-insulating 4H-SiC Determined from Spectroscopic Ellipsometry
  Published in: Silicon Carbide and Related Materials - 1999 (p571)
• Experimental Study of the Formation and Oxidation of the Sm/4H-SiC Surface Alloy
  Published in: Silicon Carbide and Related Materials 2005 (p681)
• Investigation of Variable Incidence Angle Spectroscopic Ellipsometry for Determination of Below Band Gap Uniaxial Dielectric Function
  Published in: Silicon Carbide and Related Materials 2000 (p417)
• Spectroellipsometric Method for Process Monitoring of Semiconductor Thin Films and Interfaces
  Published in: Trends and New Applications of Thin Films (p151)
• XPS Study of the Electronic Properties of the Ce/4H-SiC Interface, and the Formation of the SiO₂/Ce₂Si₂O₇/4H-SiC Interface Structure upon Oxidation
  Published in: Silicon Carbide and Related Materials 2006 (p549)