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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: Nguyen Tien Son
52 papers on 4 pages:
1
[2]
[3]
[4]
[next]
A Cause for SiC/SiO
2
Interface States: the Site Selection of Oxygen in SiC
Published in:
Silicon Carbide and Related Materials - 2002
(p535)
A Deep Photoluminescence Band in 4H SiC Related to the Silicon Vacancy
Published in:
Defects in Semiconductors 19
(p685)
A Theoretical Study on Aluminium-Related Defects in SiC
Published in:
Silicon Carbide and Related Materials 2006
(p445)
Annealing Behaviour of Vacancy-and Antisite-Related Defects in Electron-Irradiated 4H-SiC
Published in:
Silicon Carbide and Related Materials 2003
(p473)
Antisites as Possible Origin of Irradiation Induced Photoluminescence Centers in SiC: A Theoretical Study on Clusters of Antisites and Carbon Interstitials in 4H-SiC
Published in:
Silicon Carbide and Related Materials 2003
(p443)
As-Grown and Process-Induced Intrinsic Deep-Level Luminescence in 4H-SiC
Published in:
Silicon Carbide and Related Materials 2000
(p365)
Bandstructure and Transport Properties of 4H- and 6H-SiC: Optically Detected Cyclotron Resonance Investigations
Published in:
Silicon Carbide and Related Materials - 1999
(p559)
Boron Centers in 4H-SiC
Published in:
Silicon Carbide and Related Materials 2000
(p455)
Calculation of Hyperfine Constants of Defects in 4H-SiC
Published in:
Silicon Carbide and Related Materials - 2002
(p511)
Chromium in 4H and 6H SiC: Photoluminescence and Zeeman Studies
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p603)
CVD Growth and Characterisation of SiC Epitaxial Layers on Faces Perpendicular to the (0001) Basal Plane
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p123)
Deep Acceptor Levels of the Carbon Vacancy-Carbon Antisite Pairs in 4H-SiC
Published in:
Silicon Carbide and Related Materials 2006
(p449)
Deep Levels Responsible for Semi-Insulating Behavior in Vanadium-Doped 4H-SiC Substrates
Published in:
Silicon Carbide and Related Materials 2007
(p401)
Defects in High-Purity Semi-Insulating SiC
Published in:
Silicon Carbide and Related Materials 2003
(p437)
Defects in Semi-Insulating SiC Substrates
Published in:
Silicon Carbide and Related Materials - 2002
(p45)
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