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Articles by author: P. Lamparter

• Changes in Stress and Microstructure in Sputter Deposited Copper Films Due to Substrate Surface Effects
  Published in: Residual Stresses VI, ECRS6 (p691)
• Diffraction-Line Profile Analysis - A Simple Way to Characterize Ball-Milled Mo?
  Published in: European Powder Diffraction EPDIC 7 (p451)
• Stress and Diffusion in Nb-W Bilayers
  Published in: Residual Stress ECRS 5 (p405)
• Stress in Thin Layers; Grain Interaction, Elastic Constants and Diffraction Response
  Published in: Residual Stress ECRS 5 (p42)
• XRD Line Broadening Analysis with Ball Milled Palladium
  Published in: European Powder Diffraction EPDIC 8 (p119)