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Papers by Author: P. Siffert

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Gettering of Metallic Impurities by Rapid Thermal Processing

Authors: B. Hartiti, H. Amzil, D. Sayah, J.C. Muller, P. Siffert

649

Defects Induced in Silicon by Rapid Thermal Processing

Authors: B. Hartiti, H. Amzil, D. Sayah, J.C. Muller, P. Siffert

361

Developement of a Scanning Minority Carrier Transient Spectroscopy Method: Application to the Study of Gold Diffusion in a Silicon Bicrystal

Authors: T. Heiser, A. Mesli, P. Siffert

1325