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Articles by author: R. Senderák

• Amorphous W_xSi_y / Si Multilayers
  Published in: Amorphous Metallic Materials III (p303)
• Application of the Distorted-Wave Born Approximation to Interface Characterization in W/Si Multilayer Thin Films
  Published in: European Powder Diffraction 5 (p454)
• Co/Si/W/Si Multilayers with Enhanced Thermal Stability for Soft X-Ray and UV Optics
  Published in: European Powder Diffraction EPDIC 7 (p364)
• Effect of Ion-Beam Polishing on the Interface Quality in a Ti/C Multilayer Mirror for 'Water Window'
  Published in: European Powder Diffraction 6 (p184)
• X-Ray Reflectivity and Diffuse Scattering Study of Thermally Treated W_1-xSi_x/Si Multilayers
  Published in: European Powder Diffraction 4 (p505)