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Articles by author: Raffaella Lo Nigro

• Conductive Atomic Force Microscopy Studies on the Reliability of Thermally Oxidized SiO₂/4H-SiC
  Published in: Silicon Carbide and Related Materials 2006 (p501)
• Current Transport by Defects in Pr₂O₃ High K Films
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p717)
• Electron Transport and Dielectric Breakdown Kinetics in Pr₂O₃ High K Films
  Published in: Mass and Charge Transport in Inorganic Materials III (p21)
• MOCVD Route to the Fabrication of Calcium Copper Titanate (CaCu₃Ti₄O₁₂) Thin Films
  Published in: 11th International Ceramics Congress (p1194)
• Nano-Electro-Structural Evolution of Ni-Si Ohmic Contacts to 3C-SiC
  Published in: Silicon Carbide and Related Materials 2008 (p569)
• Nanoscale Imaging of CaCu₃Ti₄O₁₂ Dielectric Properties: The Role of Surface Defects
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p443)