Articles by author: Reinhard Krause-Rehberg
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Sintering of Copper, Nickel and Tungsten Studied by Positron Lifetime Spectroscopy
Published in: Positron Annihilation - ICPA-10 (p541) -
Study of Irradiation-Induced Vacancy Defects and Shallow Positron Traps in Silicon
Published in: Positron Annihilation - ICPA-11 (p602) -
Study of Plastically Deformed Semiconductors by Means of Positron Annihilation
Published in: Defects in Semiconductors 19 (p981) -
Study of The Compensating Centres in GaAs:Te by Positron Annihilation
Published in: Defects in Semiconductors 18 (p1649) -
Study of Vacancy Defects in II-VI Compouds by Means of Positron Annihilation
Published in: Defects in Semiconductors 17 (p429) -
The Sloc Positron Beam Technique – A Unique Tool for the Study of Vacancy-Type Defects in Semiconductors
Published in: Beam Injection Assessment of Defects in Semiconductors (p291) -
Vacancy Defects in Low-Temperature-Grown GaAs Observed by Continuous and Pulsed Slow Positrons
Published in: Positron Annihilation - ICPA-11 (p204) -
Vacancy Formation in GaAs under Different Equilibrium Conditions
Published in: Positron Annihilation - ICPA-13 (p54) -
Vacancy Related Metastable Defects in III-V Semiconductors - A Study of the EL2 and DX Center by Positron Annihilation, Photoconductivity and Infrared Spectroscopy
Published in: Defects in Semiconductors 17 (p1099) -
Vacancy Type Defects inGaAs After Electron Irradiation Studied by Positron Lifetime Spectroscopy
Published in: Defects in Semiconductors 18 (p1249)