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Articles by author: Sergei S. Ostapenko

• Crack Detection and Analyses Using Resonance Ultrasonic Vibrations in Full-Size Crystalline Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p509)
• Defect Characterization in Multicrystalline Silicon Using Scanning Techniques
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p259)
• Defect Engineering in Polycrystalline Silicon Using Ultrasound
  Published in: Polycrystalline Semiconductors V (p485)
• Influence of Ultrasound Vibrations on the Stable-Metastable Transitions of EL2 Centers in GaAs
  Published in: Defects in Semiconductors 17 (p1063)
• Mechanism of Ultrasonic Enhanced Hydrogenation in Poly-Si Thin Films
  Published in: Defects in Semiconductors 19 (p197)
• Optically Anisotropic Deep Luminescent Centers in GaAs
  Published in: Defects in Semiconductors 15 (p809)
• Photoluminescence and Thermally Stimulated Luminescence in Semi-Insulating SiC
  Published in: Silicon Carbide and Related Materials - 2002 (p59)
• Photoluminescence Defect Diagnostics in Poly-Si Thin Films
  Published in: Defects in Semiconductors 18 (p1897)
• Polarized Spectroscopy of Complex Luminescence Centers
  Published in: Defects in Semiconductors 16 (p1127)
• Scanning Acoustic Microscopy in Porous SiC
  Published in: Silicon Carbide and Related Materials 2001 (p687)
• The Metastable Si:(S + Cu) Defect
  Published in: Defects in Semiconductors 17 (p1167)
• Time Decay Study of the Er³⁺-Related Luminescence in In_1-xGa_xP
  Published in: Defects in Semiconductors 17 (p743)
• Ultrasound Stimulated Defect Reactions in Semiconductors
  Published in: Defect Interaction and Clustering in Semiconductors (p317)