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Papers by Author: T. Heiser

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A Study of the Copper-Pair Related Centers in Silicon

Authors: Andrei A. Istratov, T. Heiser, H. Hieslmair, C. Flink, Joachim Krüger, Eicke R. Weber

467

Copper in Silicon: Quantitative Analysis of Internal and Proximity Gettering

Authors: Scott A. McHugo, T. Heiser, H. Hieslmair, C. Flink, Eicke R. Weber, S.M. Myers, G.A. Petersen

461

Interstitial Defect Reactions in Silicion: The Case of Copper

Authors: A. Mesli, T. Heiser

89

On the Motion of Iron in Silicon at Moderate Temperatures under High Electric Fields

Authors: T. Heiser, A. Mesli, N. Amroun

173

Copper Related Defect Reactions in P-Type Silicon

Authors: A. Mesli, T. Heiser

161

Developement of a Scanning Minority Carrier Transient Spectroscopy Method: Application to the Study of Gold Diffusion in a Silicon Bicrystal

Authors: T. Heiser, A. Mesli, P. Siffert

1325