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Articles by author: Tie Bang Xie

• A Contact Stylus Profilometer Based on Linnik Interference Microscope
  Published in: Optics Design and Precision Manufacturing Technologies (p371)
• A Large Measuring Range Profilometer for Three-Dimensional Surface Topography Measurement
  Published in: Optics Design and Precision Manufacturing Technologies (p750)
• A Non-Contact Displacement Sensor with Diffraction Grating Metrology System for Profile Measurement
  Published in: Optics Design and Precision Manufacturing Technologies (p74)
• A Scanning White-Light Interferometric Profilometer for Smooth and Rough Surface
  Published in: Optics Design and Precision Manufacturing Technologies (p364)
• Absolute Measurement of Aspheric Surfaces Using White-Light Interferometry
  Published in: Optics Design and Precision Manufacturing Technologies (p80)
• The Application of Motif Characterizing Method in the Surface Topography Evaluation of MEMS Device
  Published in: Optics Design and Precision Manufacturing Technologies (p210)
• The Design of an Online Measuring Instrument for Rolling Guide Grinding Process Size
  Published in: Equipment Manufacturing Technology (p276)