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Articles by author: V.B. Neimash

• A Deep Level Study of High-Temperature Electron-Irradiated n-Type Cz Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p367)
• Intrinsic Gettering of Radiation Defects in Silicon Caused by High-Temperature Oxygen-Containing Defects
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p87)
• On the Effect of Lead on Irradiation Induced Defects in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p373)
• Peculiarities of Behavior of Irradiated Heat-Treated Si
  Published in: Defects in Semiconductors 15 (p165)
• Radiation Defects and Carrier Lifetime in Tin-Doped n-Type Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p425)
• The Nature of Precursors for the Thermal Donor Formation in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p351)