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Articles by author: W. Pitschke

• Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry
  Published in: European Powder Diffraction 4 (p171)
• Correction of the Microabsorption Effect in Rietveld Analysis
  Published in: European Powder Diffraction 3 (p103)
• Formation of Nanocrystalline Re-Si Thin Film Composites
  Published in: European Powder Diffraction EPDIC 7 (p352)
• High Temperature X-Ray Diffraction Studies of the Phase Formation Process of Iridium Silicide Thin Films
  Published in: European Powder Diffraction 5 (p448)
• High Temperature X-Ray Diffraction: Uncertainties in Temperature Measurement and Intensity Limitations
  Published in: European Powder Diffraction 5 (p248)
• Thermoelectric Properties of Layer-Structured (ZnO)_mIn₂O₃(m=Integer) and Effects of Elemental Substitution
  Published in: Electroceramics in Japan II (p71)
• X-Ray Diffraction Studies of the Phase Formation in thin In/Ni Films
  Published in: European Powder Diffraction (p897)