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Papers by Author: W. Pitschke

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Formation of Nanocrystalline Re-Si Thin Film Composites

Authors: W. Pitschke, D. Hofman, A.T. Burkov, J. Schumann, A. Heinrich

352

Thermoelectric Properties of Layer-Structured (ZnO)_mIn₂O₃(m=Integer) and Effects of Elemental Substitution

Authors: Mitsuhiko Ohta, Won Seon Seo, W. Pitschke, Kunihito Koumoto

71

High Temperature X-Ray Diffraction Studies of the Phase Formation Process of Iridium Silicide Thin Films

Authors: R. Kurt, W. Pitschke, A. Heinrich, K. Wetzig

448

High Temperature X-Ray Diffraction: Uncertainties in Temperature Measurement and Intensity Limitations

Authors: W. Pitschke, A. Teresiak

248

Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry

Authors: W. Pitschke

171

Correction of the Microabsorption Effect in Rietveld Analysis

Authors: W. Pitschke, N. Mattern, H.U. Hermann

103

X-Ray Diffraction Studies of the Phase Formation in thin In/Ni Films

Authors: W. Pitschke, N. Mattern, J. Tutschku, R. Rosenkranz

897