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Papers by Author: X.D. Chen

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Identities of the Deep Level Defects E₁/E₂ in 6H Silicon Carbide

Authors: C.C. Ling, X.D. Chen, M. Gong, H.M. Weng, D.S. Hang, C.D. Beling, S. Fung, T.W. Lam, C.H. Lam

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Recent Advances in Defect Characterization in 6H-SiC Using Deep Level Transient Spectroscopy and Positron Annihilation Spectroscopy

Authors: C.C. Ling, C.D. Beling, M. Gong, X.D. Chen, S. Fung

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