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Papers by Keyword: BKD

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Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction

Authors: Robert A. Schwarzer

23

Crystal Texture and Electromigration Damage in Al-Based Interconnect Lines Studied by ACOM with the SEM

Authors: M. Lepper, A. von Glasow, D. Piscevic, Robert A. Schwarzer

573

In Situ Recrystallization of Copper Studied by Individual Grain Orientation Measurement in the SEM

Authors: F. Springer, M. Radomski

497

Inhomogeneous Texture Distributions Imaged by ACOM and X-Ray Pole Figure Measurement

Authors: F. Springer, No Jin Park

489

Texture of Shear Bands in Al-Mg 3% (AA5182) Measured by BKD

Authors: A. Huot, Robert A. Schwarzer, Julian H. Driver

319

Determination of the Grain Boundary Misorientation for the Analysis of the Discontinuous Ordering Reaction in Fe-50 at. % Co

Authors: E. Bischoff, V. Semenov, Eugen Rabkin, W. Gust

243

Automated Crystal Orientation Mapping (ACOM) with a Computer-Controlled TEM by Interpreting Transmission Kikuchi Patterns

Authors: Robert A. Schwarzer, J. Sukkau

215

Recent Developments in Automated Crystal Orientation Mapping (ACOM) - Quantitative Evaluation and Graphical Representation of Individual Grain Orientation Data

Authors: F. Springer

191

Sampling Error of Texture Approximation by Individual Orientation Measurement

Authors: B. Schäfer

99

Processing Indiviual Orientation Data to Calculate ODFs

Authors: Francis Wagner, Siegfried Matthies, O. Van Landuyt

89