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Papers by Keyword: Carrier Profiling

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Quantitative High-Resolution Two-Dimensional Profiling of SiC by Scanning Capacitance Microscopy

Authors: Vito Raineri, Filippo Giannazzo, Lucia Calcagno, Paolo Musumeci, Fabrizio Roccaforte, Francesco La Via

655

Scanning Capacitance Microscopy on Semiconductor Materials

Authors: Vito Raineri, Filippo Giannazzo

425