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Papers by Keyword: Doppler-Shift

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Investigation of SiO₂/SiC Interface using Positron Annihilation Technique

Authors: Masaki Maekawa, Atsuo Kawasuso, Masahito Yoshikawa, Ayahiko Ichimiya

1301

Structural Defects at SiO₂/SiC Interfaces Detected by Positron Annihilation

Authors: Masaki Maekawa, Atsuo Kawasuso, Masahito Yoshikawa, Hisayoshi Itoh

559