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Articles by keyword: «Electrical Breakdown»

• Acceleration Factors in Acceleration Life Test of Thermal Oxides on 4H-SiC Wafers
  Published in: Silicon Carbide and Related Materials 2006 (p635)
• Basic Laws of Electrical Breakdown of Thin Dielectric Layers
  Published in: Passivation of Metals and Semiconductors (p543)
• Breakdown Behavior of 900-V 4H-SiC Schottky Barrier Diodes Terminated with Boron-Implanted pn-Junction
  Published in: Silicon Carbide and Related Materials 2007 (p955)
• Classification of Recombination-Active Defects in Multicrystalline Solar Cells Made from Upgraded Metallurgical Grade (UMG) Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p88)
• DX Center Breakdown in High Electric Fields
  Published in: Ultrafast Phenomena in Semiconductors (p25)
• Effect of Internal Electrical Field on the Electrical Breakdown Properties of Contact Materials
  Published in: Sustainable Construction Materials and Computer Engineering (p154)
• Semiconducting Characteristics of Lithium-Doped MgO Crystals
  Published in: Defects in Insulating Materials (p41)