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Articles by keyword: «Electronic Devices»

• Application of X-Ray and Neutron Diffraction Methods to Reliability Evaluation of Structural Components and Electronic Device
  Published in: Residual Stresses VII, ICRS7 (p19)
• Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors
  Published in: Advanced Materials Forum III (p13)
• Instability of OTFT with Organic Gate Dielectrics
  Published in: Advances in Nanomaterials and Processing (p407)
• New Amorphous Oxide Semiconductor for Thin Film Transistors (TFTs)
  Published in: Advanced Materials Forum IV (p348)
• Observation and Modelization of the Electrostatic Force due to the Local Variations of the Surface Potential by Electrostatic Force Microscopy (EFM)
  Published in: Beam Injection Assessment of Defects in Semiconductors (p283)
• Synthesis and Characterization of Highly Cross-Link Polysiloxane Based on 2,4,6,8- Tetramethyl-2,4,6,8- Tetravinylcyclotetrasiloxane
  Published in: Manufacturing Science and Technology (p2393)