Papers by Keyword: Film Structure

Abstract: Surface mulch is regarded as an effective manner to reducing soil water evaporation, but limited with the adverse influence of plastic film mulch on agro-ecosystems. In this paper, liquid films were prepared with the foundation of kelp as a bio-material. The results showed that the films prepared with the mixture of kelp and polyvinyl alcohol (PA) had superimposed layering structure with tiny pores and gaps, and were stable as well as degradable under field water conditions. The results of the simulative experiments with both of aquic sand-loamy soil and yellow silt-loamy soil that mulching with the film of the mixture of kelp and polyvinyl alcohol (PA) could significantly (P<0.01) reduce water evaporation from soil. It was also found that mulching with the liquid films could increase the water retention capacity of the tested soils. As the initial material – kelp is available, the application of the developed liquid film based on kelp for efficient soil moisture management in agricultural production should be recommended.

Abstract: TiO2 thin films were deposited from Ti2¬O3, TiO2 and Ti3O5 source materials by e-beam. The refractive index and extinction coefficient of the films in the visible and near infrared（IR） region were measured. The structural and chemical properties of the films were investigated by x-ray diffraction (XRD), atomic force microscopy (AFM) and x-ray photoelectron spectroscopy (XPS). XRD measurements revealed that all the deposited films were amorphous. XPS analysis showed the films were stoichiometric TiO2. The AFM investigation confirmed that the surface roughness of the films was dependent on the deposition conditions.

Abstract: Pb(Zr0.53Ti0.47)O3 thin films with thickness of 120nm, 190nm, 310nm, 440nm and 630nm were deposited on Pt/Ti/SiO2/Si substrates by sol-gel process through repeating spining process 2 times, 4 times, 6 times, 8 times and 10 times respectively. The structures of PZT films were investigated by SEM and XRD analysis. The ferroelectric hysteresis loops were recorded by Radiant Precision Workstation and dielectric properties were measured using an Agilent HP4294A impedance analyzer. X-ray diffraction indicated that with the film thickness increasing, the diffraction intensity increased. The thickness of PZT film had great effect on ferroelectric and dielectric properties. Conclusively when the film thickness was about 310nm, the PZT thin films possessed better ferroelectric and dielectric properties.