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Keyword: "High Frequency C-V Characteristics"
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Paper Title Page

Deep States in SiO2/p-Type 4H-SiC Interface

Authors: Hiroshi Yano, N. Inoue, Tsunenobu Kimoto, Hiroyuki Matsunami

841

Effect of High-Dose Aluminium Implantation on 4H-SiC Oxidation

Authors: Lin Cheng, Janna R. B. Casady, Janice Mazzola, Jeff B. Casady, Yaroslav Koshka, V. Bondarenko

885

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