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Articles by keyword: «InSb»

• Comparison between AS-Grown and Annealed Quantum Dots Morphology
  Published in: Defects in Semiconductors 19 (p1689)
• Crystallization of InSb Phase Near the Bonding Interface of Silicon-on-Insulator Structure
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p137)
• Dependence of Structural Stress on Indium Bump Sizes in 8×8 InSb Focal Plane Array
  Published in: Manufacturing Process Technology (p2289)
• Fabrication of a Peltier Device Based on InSb and SbTe Thin Films
  Published in: NEMS/MEMS Technology and Devices - ICMAT2011 (p50)
• Finite Element Analysis on Structural Stress of 64×64 InSb Infrared Focal Plane Array
  Published in: Mechanical Engineering and Green Manufacturing (p212)
• Finite Element Analysis on Structural Stress of 8×8 InSb Infrared Focal Plane Array
  Published in: Mechanical Engineering and Green Manufacturing (p207)
• Finite Element Analysis on Structural Stress of 8×8 InSb Infrared Focal Plane Array with Underfill
  Published in: Advanced Manufacturing Systems (p108)
• Finite Element Analysis on Structural Stress of Large Format InSb Infrared Focal Plane Array
  Published in: New Materials and Advanced Materials (p1721)
• Generation of Donor Centers in p-InSb Laser Radiation
  Published in: Ultrafast Phenomena in Semiconductors (p311)
• Laser Diagnostics of InSb Surface
  Published in: Semiconductor Processing and Characterization with Lasers (p215)
• Morphological, Structural and Electronic Damage on InAs and InSb Surfaces Induced by (Reactive) Ion Beam Etching
  Published in: Defects and Diffusion in Semiconductors (p127)
• Redistribution of Point Defects in the Crystalline Lattice of a Semiconductor in an Inhomogeneous Temperature Field
  Published in: Defects and Diffusion in Semiconductors (p89)
• Structural Stress Analysis of 16×16 InSb Infrared Focal Plane Array with Underfill
  Published in: Frontiers of Manufacturing and Design Science II (p4320)
• Structure and Composition Study of InSb Films Prepared by Radio-Frequency Sputtering
  Published in: Materials Science and Engineering Applications (p886)
• Study of Donor Centres in n-InSb due to the Temperature Annealing
  Published in: Cross-Disciplinary Applied Research in Materials Science and Technology (p197)