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Articles by keyword: «NEXAFS»

• Advanced Metrologies for Cleans Characterization: ARXPS, GIXF and NEXAFS
  Published in: Ultra Clean Processing of Semiconductor Surfaces VIII (p281)
• On the Nanostructure of Cu in Ti_xCu_1-x and TiN/Cu Films: A XAFS Study
  Published in: Journal of Nano Research Vol. 6 (p43)
• Preparation and Characterization of Self-Assembled Monolayers on Germanium Surfaces
  Published in: Ultra Clean Processing of Semiconductor Surfaces IX (p169)
• Theoretical and Experimental Ti-K NEXAFS of Various Ti-Oxides
  Published in: PRICM-5 (p3119)
• TXRF Analysis of Low Z Elements and TXRF-NEXAFS Speciation of Organic Contaminants on Silicon Wafer Surfaces Excited by Monochromatized Undulator Radiation
  Published in: Ultra Clean Processing of Silicon Surfaces VI (p165)
• X-Ray Spectrometry for Wafer Contamination Analysis and Speciation as Well as for Reference-Free Nanolayer Characterization
  Published in: Ultra Clean Processing of Semiconductor Surfaces VIII (p277)