Papers by Keyword: Open-Volume Defect

Paper TitlePage

Investigation of SiO2/SiC Interface using Positron Annihilation Technique
Authors: Masaki Maekawa, Atsuo Kawasuso, Masahito Yoshikawa, Ayahiko Ichimiya
1301
Structural Defects at SiO2/SiC Interfaces Detected by Positron Annihilation
Authors: Masaki Maekawa, Atsuo Kawasuso, Masahito Yoshikawa, Hisayoshi Itoh
559
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