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Articles by keyword: «Oxygen Precipitation»

• In Situ Observation of Oxygen Precipitation in Silicon with High Energy X-Rays
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p437)
• About the Electrical Properties of Oxygen Phases Segregated by Annealing Cz Silicon in the 600-800°C Range
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p327)
• Analysis of Minute StrainFields around Microdefects in Silicion Crystals by Plane-Wave X-Ray Topography
  Published in: Defect and Diffusion Forum Vols. 138-139 (p49)
• Defect Analysis in Semiconductor Materials Based on p-n Junction Diode Characteristics
  Published in: Defects and Diffusion in Semiconductors - An Annual Retrospective IX (p1)
• Defects Involving Oxygen in Crystalline Silicon
  Published in: Defect Interaction and Clustering in Semiconductors (p285)
• EBIC Characterization of Oxygen Precipitation and Denuded Zone in Intrinsically Gettered P-Type Czochralski Silicon
  Published in: Beam Injection Assessment of Defects in Semiconductors (p97)
• EBIC Study of Electrical Activity of Stacking Faults in Multicrystalline Sheet Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p627)
• Effect of Annealing Temperature on the Properties of Silicon Crystal
  Published in: Advanced Materials (p1323)
• Effect of Heavy Carbon, Nitrogen and Boron Doping on Oxygen Precipitation Behavior in Silicon Epitaxial Wafers
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p49)
• Effect of Oxygen in Low Temperature Boron and Phosphorus Diffusion Gettering of Iron in Czochralski-Grown Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p395)
• Electron Beam Induced Current Contrast of Oxygen Precipitation Related Defects in Czochralski Silicon
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p237)
• Evaluation Method of Precipitated Oxygen Concentration in Low Resistivity Silicon Wafers Using X-Ray Diffration
  Published in: Defects in Semiconductors 18 (p1865)
• Experimental and Numerical Investigation of the Oxygen Precipitation in Mono- and Multicrystalline Solar Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p315)
• Extended Defects in Silicon: an Old and New Story
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p263)
• External Gettering around Extended Defects in Multicrystalline Silicon Wafers
  Published in: Polycrystalline Semiconductors III (p361)