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Papers by Keyword: Phenomenological Equations

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A New Approach to Understanding Electromigration in Al(Cu) Alloys on an Atomistic Basis

Authors: C. Schmidt, J.P. Dekker, P. Gumbsch, E. Arzt

151

Formation of Microscopic Distribution of Grown-In Defects in Czochralski Silicon Crystal

Authors: R. Habu, Kazuto Kawakami, Mitsuhiro Hasebe

27