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Keyword: "Reverse Breakdown"
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Paper Title Page

Measurements of Breakdown Field and Forward Current Stability in 3C-SiC pn Junction Diodes Grown on Step-Free 4H-SiC

Authors: Philip G. Neudeck, David J. Spry, Andrew J. Trunek

1335

Nanosecond Risetime Pulse Characterization of SiC p+n Junction Diode Breakdown and Switching Properties

Authors: Philip G. Neudeck, C. Fazi

1037

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