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Articles by keyword: «S-Parameter»

• A Positron Study of the Temperature Dependence of the Guinier-Preston Zone Composition in Al-Ag Alloys
  Published in: Positron Annihilation - ICPA-9 (p981)
• Comparison of Vacancy Creation by Nuclear and Electronic Processes in Silicon Irradiated with Swift Kr and Bi Ions
  Published in: Positron Annihilation - ICPA-13 (p93)
• Defect Analysis in B2-Type FeAl Alloys by Positron Annihilation Measurements at 100K
  Published in: Positron Annihilation - ICPA-12 (p201)
• Design and Implementation of a S-Parameter Wafer Defect Scanner
  Published in: Positron Annihilation - ICPA-13 (p501)
• Fabrication, Characterization, and Modeling of SiC MESFETs
  Published in: Silicon Carbide and Related Materials - 1999 (p1259)
• Native Defects in n-type Sn-Doped GaAs Using Positron Annihilation Technique
  Published in: Positron Annihilation - ICPA-13 (p174)
• Positron Annhilation in the Ba(PO₃ )₂ - Na₃ AlF₆ Glass System
  Published in: Positron Annihilation - ICPA-9 (p953)
• Positron Annihilation Studies of Vacancy Defects in Crystalline and Amorphous Si
  Published in: Defects and Diffusion in Semiconductors IV (p189)
• S-Parameter Measurements and Residual Gas Analysis of Rock Samples as a Function of Temperature
  Published in: Positron Annihilation - ICPA-11 (p623)
• S-Parameters and Count-Rate
  Published in: Positron Annihilation - ICPA-9 (p1861)
• The Recovery Behavior of Quenched-In Vacancies in CuAlBe Shape Memory Alloys
  Published in: Positron Annihilation - ICPA-9 (p1317)
• The Specific Capture Rate of Positrons at Dislocation in Copper
  Published in: Positron Annihilation - ICPA-9 (p885)