Keyword: "Specific Contact Resistance"
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Aluminum Implantation in 4H-SiC: Physical and Electrical Properties

Authors: Jean François Michaud, X. Song, J. Biscarrat, F. Cayrel, E. Collard, D. Alquier

581

Comparison of Different Surface Pre-Treatments to n-Type 4H-SiC and their Effect on the Specific Contact Resistance of Ni Ohmic Contacts

Authors: G. Pope, Owen J. Guy, Philip A. Mawby

833

Electrical Characterization of Nitrogen Implanted 3C-SiC by SSRM and C­TLM Measurements

Authors: Xi Song, Anne Elisabeth Bazin, Jean François Michaud, Frédéric Cayrel, Marcin Zielinski, Marc Portail, Thierry Chassagne, Emmanuel Collard, Daniel Alquier

193

Electrical Characterization of p-Type 6H-SiC Layers Created by C and Al Co-implantation

Authors: Kiyoshi Tone, S.R. Weiner, Jian H. Zhao

689

Electrical Properties of Graphite/p-Type Homoepitaxial Diamond Contact

Authors: Yigang Chen, Mitsuru Hasegawa, S. Yamanaka, Hideyo Okushi, Naoto Kobayashi

945

Formation of Large Area Al Contacts on 6H- and 4H-SiC Substrates

Authors: Oleg Korolkov, Toomas Rang

603

Low Resistance Ohmic Contacts to n-SiC Using Niobium

Authors: T.N. Oder, John R. Williams, K.W. Bryant, M.J. Bozack, John Crofton

997

Low Specific Contact Resistance to 3C-SiC Grown on (100) Si Substrates

Authors: Anne Elisabeth Bazin, Thierry Chassagne, Jean François Michaud, André Leycuras, Marc Portail, Marcin Zielinski, Emmanuel Collard, Daniel Alquier

721

Micro- and Nano-Scale Electrical Characterization of Epitaxial Graphene on Off-Axis 4H-SiC (0001)

Authors: Filippo Giannazzo, Corrado Bongiorno, Salvatore Di Franco, Emanuele Rimini, Vito Raineri

637

Nano-Electro-Structural Evolution of Ni-Si Ohmic Contacts to 3C-SiC

Authors: Jens Eriksson, Fabrizio Roccaforte, Filippo Giannazzo, Raffaella Lo Nigro, Giuseppe Moschetti, Vito Raineri, Jean Lorenzzi, Gabriel Ferro

569

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