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Articles by keyword: «TLM»

• Al-Free Nanolayered Metallization Systems for Sub-Micron HEMTs
  Published in: Journal of Nano Research Vol. 17 (p203)
• Comparison of Electrical Properties of Ohmic Contact Realized on p-Type 4H-SiC
  Published in: Silicon Carbide and Related Materials 2007 (p639)
• Composition and Interface Chemistry Dependence in Ohmic Contacts to GaN HEMT Structures on the Ti/Al Ratio and Annealing Conditions
  Published in: Silicon Carbide and Related Materials 2008 (p951)
• Current Transport in Ti/Al/Ni/Au Ohmic Contacts to GaN and AlGaN
  Published in: Silicon Carbide and Related Materials 2006 (p1027)
• Current Voltage Characteristics of High-Voltage 4H Silicon Carbide Diodes
  Published in: Silicon Carbide and Related Materials - 1999 (p1323)
• Electrical Characterization of Nickel Silicide Contacts on Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2001 (p893)
• Investigations on Ni-Ti-Al Ohmic Contacts Obtained on P-Type 4H-SiC
  Published in: HeteroSiC & WASMPE 2011 (p169)
• Origin of the Excellent Thermal Stability of Al/Si-Based Ohmic Contacts to p-Type LPE 4H-SiC
  Published in: Silicon Carbide and Related Materials 2000 (p251)
• Structural Analysis of Au/Ti/Al/SiC Contacts in Dependence on the Initial Composition and Annealing
  Published in: Journal of Nano Research Vol. 12 (p55)
• Toward a Better Understanding of Ni-Based Ohmic Contacts on SiC
  Published in: Silicon Carbide and Related Materials 2010 (p465)