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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 150-151

Defect and Diffusion Forum Vols. 150-151

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.150-151

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Table of Contents

Abstract Title Page

Simulation of Dislocation Configurations in the Presence of Mobile Point Defects

496

Calculation of Moments of Dislocation Pile-ups from the Stress Intensity Factor

497

Effects of Crack-Tip Geometry upon Dislocation Emission and Cleavage

498

Correlation between Dislocation Configuration and Scattering Behavior of Hexagonal Close-Packed Single Crystals

499

Motion of a Screw Dislocation in a Two-Dimensional Peierls Potential

500

Critical Configurations for Dislocation Nucleation Front Crack Tips

501

Surface Step-Dislocation Transition and Nucleation at a Solid Free Surface

502

Planar Defects, Monte Carlo Simulation of the Electron Beam-Induced Current Grain-Boundary Contrast in Semiconductors

503

Tilt Boundary as a Set of Randomly Distributed Dislocations

504

Imaging of Grain Boundaries via Field Emission Auger Microprobes

505