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Vols. 153-155

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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 153-155

Defect and Diffusion Forum Vols. 153-155

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.153-155

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Table of Contents

Abstract Title Page

Si: Si Bulk Diffusion - Theoretical Analysis - Effect of Pressure

794

Si: Si Bulk Diffusion - Theoretical Analysis - Effect of Trapping

795

Si: Si Bulk Diffusion - Theoretical Analysis - Effect upon Defects

796

Si: Si Bulk Diffusion - Theoretical Analysis - Effect upon Defects

797

Si: Si Bulk Diffusion - Theoretical Analysis - Potential Function

798

Si: Si Grain Boundary Diffusion - Qualitative Observations - Effect of Electromigration

799

Si: Si Surface Diffusion - Quantitative Data

800

Si: Si Surface Diffusion - Quantitative Data

801

Si: Si Surface Diffusion - Quantitative Data

802

Si: Si Surface Diffusion - Quantitative Data

803