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Residual Stress Distribution in Pure Bending Beam Subjected to Tensile Failure on One Side
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Micro Diffraction Imaging of Bulk Polycrystalline Materials
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Determination of Residual Stress Fields with High Local Resolution
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Aspects of Residual Stress Determination Using Energy-Dispersive Synchrotron X-Ray Diffraction

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Abstract:

In this paper we discuss certain aspects of residual stress measurements using energy-dispersive synchrotron X-ray diffraction using very high X-ray energies in the range up to 200keV. In particular, we focus on the strain resolution and its relation to the geometric contribution to the instrumental resolution. This energy range together with the brilliance of insertion devices allows measurements in bulk materials with penetration approaching those of neutrons, and the technique is demonstrated to have a high potential for residual stress determination. However, the use of high X-ray energies implies a relatively small diffraction angle and in turn a relatively elongated gauge volume, which favours the application of the technique to essentially 2D problems.

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Periodical:

Materials Science Forum (Volumes 524-525)

Pages:

267-272

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.524-525.267

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Online since:

September 2006

Authors:

Axel Steuwer, Matthew J. Peel, Thomas Buslaps

Keywords:

Energy Dispersive, Residual Stress, Synchrotron X-Ray Diffraction

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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