Residual Stress Evolution during Decomposition of Ti(1-x)Al(x)N Coatings Using High-Energy X-Rays

Mark R. Terner; Peter Hedström; Jonathan Almer; J. Ilavsky; Magnus Odén

doi:10.4028/www.scientific.net/MSF.524-525.619

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Measurement of Residual Stresses in Thin Films by Two-Dimensional XRD
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Residual Stress Evolution during Decomposition of Ti_(1-x)Al_(x)N Coatings Using High-Energy X-Rays
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A Comparative Study of Microstructure and Residual Stresses of CMT-, MIG- and Laser-Hybrid Welds
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In Situ Neutron Diffraction Study on the Mechanical Behavior of an Ultra-Fine-Grained Steel
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HomeMaterials Science ForumMaterials Science Forum Vols. 524-525Residual Stress Evolution during Decomposition of...

Residual Stress Evolution during Decomposition of Ti_(1-x)Al_(x)N Coatings Using High-Energy X-Rays

Abstract:

Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360° and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.