Materials Science & Technology

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9/7/2009 - 9/10/2009
6/28/2009 - 7/3/2009

New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction

doi:10.4028/0-87849-661-0.163
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