Paper Titles
Study of Deformation Microstructure and Static Recovery in Copper after Cold Drawing
p.27
Potentiality of Mean-Field Approaches for Recrystallisation: Characterization of the Deformed State of Polycrystals
p.33
Evaluation of Stored Energy in Cold-Rolled IF Steels from EBSD Data and Its Application to Recrystallization Modeling
p.39
An Impingement – Spheroidisation Theory for Nucleation and Grain Growth
p.45
Estimation of Stored Energy Distribution from EBSD Measurements
p.51
Relation between Activated Slip Systems and Nucleation of Recrystallized Grains in Deformed Single- and Bi-Crystals
p.57
The Effect of Initial Grain Size on the Microstructures Developed during Cold Rolling of a Single-Phase Aluminium Alloy
p.63
Orientation Spread in Deformed Grains and Its Relevance to Recrystallization Texture Development in IF Steels
p.69
Investigation of Nucleation Mechanisms of Recrystallization in Warm Rolled Fe3Al Base Alloys
p.75

Estimation of Stored Energy Distribution from EBSD Measurements

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Abstract:

Wire-drawn copper has been investigated with Electron Back Scattered Diffraction technique in a Scanning Electron Microscope after deformation by wire-drawing. In this paper, we show how to get qualitative informations about the deformation inhomogeneities related to the stored energy distribution, from the analysis of the quality index. Furthermore, the microstructural analysis in the wire diameter is completed using the quality index distribution approach. A relation between diameter of the wire and stored energy distribution is then qualitatively set. In order to validate the proposed method, the EBSD data are compared with the stored energy values obtained from neutron diffraction measurements.

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Periodical:

Materials Science Forum (Volumes 467-470)

Pages:

51-56

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.467-470.51

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Online since:

October 2004

Authors:

Ph. Gerber, Thierry Baudin, S. Jakani, Marie Helene Mathon, Brigitte Bacroix

Keywords:

Copper (Cu), Electron Backscatter Diffraction (EBSD), Quality Index, Stored Energy, Texture, Wire-Drawing

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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