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Local Grain Boundary Property Measurements
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HomeSolid State PhenomenaSolid State Phenomena Vols. 37-38Local Grain Boundary Property Measurements

Local Grain Boundary Property Measurements

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Polycrystalline Semiconductors III

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Periodical:

Solid State Phenomena (Volumes 37-38)

Pages:

171-182

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.37-38.171

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Online since:

March 1994

Authors:

D.B. Holt

Keywords:

Cathodoluminescence, Electron Beam Induced Current (EBIC), Grain Boundary Electrical Effects, Luminescent Effects, Scanning Electron Microscope (SEM)

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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