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Local Grain Boundary Property Measurements
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Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping
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HomeSolid State PhenomenaSolid State Phenomena Vols. 37-38Local Investigation of the Electrical Properties...

Local Investigation of the Electrical Properties of Grain Boundaries in Silicon

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Polycrystalline Semiconductors III

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Periodical:

Solid State Phenomena (Volumes 37-38)

Pages:

183-188

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.37-38.183

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Online since:

March 1994

Authors:

J. Palm, D. Steinbach, H. Alexander

Keywords:

Defect Electronics, Grain Boundary, Local Characterization Techniques

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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