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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64Near-Field Cathodoluminescence (NF-CL)...

Near-Field Cathodoluminescence (NF-CL) Investigations on Semiconducting Materials

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Abstract:

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Beam Injection Assessment of Defects in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

257-260

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.257

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Online since:

December 1998

Authors:

V. Ebinghaus, R.M. Cramer, R. Heiderhoff, L.J. Balk

Keywords:

Cathodoluminescence, Scanning Electron Microscope (SEM), SNOM

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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