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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64Local Stress, Surface Reconstruction, and Bulk...

Local Stress, Surface Reconstruction, and Bulk Defect Nucleation: An STM Study on Silicon

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Abstract:

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Beam Injection Assessment of Defects in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

261-272

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.261

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Online since:

December 1998

Authors:

Hans Joachim Müssig, Jaroslaw Dąbrowski

Keywords:

Ab Initio Quantum Mechanical Calculations, Ab Initio Quantum Mechanical Methods, Antimony, Chemisorption, Density Functional Calculation, Low Index Single Crystal Surface, Scanning Tunneling Microscopy (STM), Silicon, Surface Reconstruction, Surface Relaxation

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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