Paper Titles

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Observation and Modelization of the Electrostatic Force due to the Local Variations of the Surface Potential by Electrostatic Force Microscopy (EFM)
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The Sloc Positron Beam Technique – A Unique Tool for the Study of Vacancy-Type Defects in Semiconductors
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Minority Carrier Transient Spectroscopy of Copper-Silicide and Nickel-Disilicide Precipitates in Silicon
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Grain Growth of ZnSe Recrystallized in the Solid Phase
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Lateral Doping Inhomogeneities as Revealed by μ-NEXAFS and μ-PES
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Application of Surface Electron Beam Induced Voltage Method for the Contactless Characterization of Semiconductor Structures
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Modification of Electronical and Optical Properties in SiO₂ Films by Electron Beam Irradiation
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Fabrication and Ellipsometric Investigation of Thin Films of Rare-Earth Oxides
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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64Grain Growth of ZnSe Recrystallized in the Solid...

Grain Growth of ZnSe Recrystallized in the Solid Phase

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Beam Injection Assessment of Defects in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

311-316

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.311

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Online since:

December 1998

Authors:

S. Fusil, A. Zozime, R. Pénelle, F. Grillon, C. Le Paven, Andre Rivière, R. Triboulet

Keywords:

Abnormal Growth, II-VI Compounds, Pinning, Texture

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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